QRM QRM-MicroBar測(cè)試卡，QRM-MicroBar測(cè)試模體,Micro-CT高分辨率測(cè)試卡 技術(shù)參數(shù)：
內(nèi)含兩個(gè)3mm×3mm硅質(zhì)芯片，分別水平和垂直安裝，芯片上刻有條狀（溝槽）和點(diǎn)狀圖樣，度規(guī)格為：1μm，2μm，3μm，4μm，5μm，6μm，7μm，8μm，9μm，10μm.

作為我們流行的MicroCT-BarPattern-Phantom的進(jìn)一步發(fā)展，我們現(xiàn)在推出BarPattern-NANO！

QRM QRM-MicroBar測(cè)試卡，QRM-MicroBar測(cè)試模體,Micro-CT高分辨率測(cè)試卡易于使用的幻像提供了兩個(gè)硅芯片，它們垂直對(duì)齊并放置在堅(jiān)固的塑料支架上。
兩種3 x 3mm²的芯片都具有數(shù)個(gè)線和點(diǎn)圖案，分別代表線和點(diǎn)的寬度為1至10 µm。

此外，在芯片上還放置了鋸齒狀邊緣（L）和西門子星（放射狀星）。
芯片上的不同結(jié)構(gòu)以這種方式布置在芯片上，從而可以通過一次測(cè)量在圖像/芯片的中心以及外圍區(qū)域中確定空間分辨率。

芯片上的線型和點(diǎn)型：3 x 3mm²
結(jié)構(gòu)的深度在5和15 µm之間變化。

QRM QRM-MicroBar測(cè)試卡，QRM-MicroBar測(cè)試模體,Micro-CT高分辨率測(cè)試卡技術(shù)指標(biāo)
基礎(chǔ)材料：    固體塑料（切屑放在空氣中的支撐件上-壁厚> 0.3 mm）
直徑幻影：    5.2毫米
高度：    19毫米
硅芯片的措施：    3 x 3 x 0.66毫米
芯片上的結(jié)構(gòu)（分辨率）：    分別為1至10 µm。500至50 LP / mm
芯片材質(zhì)：    硅
圖案對(duì)比    硅/空氣










As a further development of our popular MicroCT-BarPattern-Phantom we now present the BarPattern-NANO!

The easy and convenient to use phantom provides two silicon chips, perpendicularly aligned and placed on a solid plastic support.
Both 3 x 3 mm² chips exhibit several line and point pattern representing lines and points of 1 to 10 µm width.

In addition a slented edge (L) and a Siemens-star (actinomorphic star) are also placed on the chip.
The different structures on the chip are arranged in such a way over the chip, that spatial resolution can be determined in the center as well as in the peripheral regions of the image/chip with a single measurement.

Line- and Pointpattern on the chip: 3 x 3 mm²
The depth of the structures varies within 5 and 15 µm.

Specifications
Base material:    solid plastic (chips placed on support in air -> 0.3 mm wall thickness)
Diameter Phantom:    5.2 mm
Height:    19 mm
measures of silicon chip:    3 x 3 x 0.66 mm
structures on the chip (resolution):    1 to 10 µm, resp. 500 to 50 LP/mm
Material of chip:    silicon
Contrast of pattern    silicon / air